Testability calculation for digital circuits with decision diagrams
author
Ubar, Raimund-Johannes
statement of authorship
Raimund Ubar
source
3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers
location of publication
[S.l.]
year of publication
2002
pages
p. 137-143 : ill
url
https://dblp.org/rec/conf/latw/Ubar02.html
subject term
digitaalintegraallülitused
testimine
kvaliteeditestid
otsustusteooria
otsustusdiagrammid
arvutusmeetodid
notes
Bibliogr.: 13 ref
language
inglise