Energy minimization for hybrid BIST in a system-on-chip test environment
author
Ubar, Raimund-Johannes
Shchenova, Tatjana
Jervan, Gert
Peng, Zebo
statement of authorship
Raimund Ubar, Tatjana Shchenova, Gert Jervan, Zebo Peng
source
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
location of publication
Los Alamitos
publisher
IEEE
year of publication
2005
pages
p. 2-7 : ill
ISBN
0-7695-2341-2
notes
Bibliogr.: 30 ref