prindi

Hierarchical test generation for finite state machines

autor
Brik, Marina
Ubar, Raimund-Johannes
vastutusandmed
M.Brik, R.Ubar
allikas
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
ilmumiskoht
Tallinn
ilmumisaasta
1994
leheküljed
p. 319-324: ill
märksõna
testimine
graafid
VLSI-ahelad
ISBN
9985-59-012-0
märkused
Bibl. 10 ref
keel
inglise
Brik, M., Ubar, R. Hierarchical test generation for finite state machines // BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1. Tallinn, 1994. p. 319-324: ill.