New method of testability calculation to guide RT-level test generation
vastutusandmed
Jaan Raik, Tanel Nõmmeots, Raimund Ubar
allikas
4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003
ilmumiskoht
[S. l.]
ilmumisaasta
leheküljed
p. 46-51 : ill
märkused
Bibliogr.: 12 ref
keel
inglise
Raik, J., Nõmmeots, T., Ubar, R.-J. New method of testability calculation to guide RT-level test generation // 4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003. [S. l.], 2003. p. 46-51 : ill.