A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs
author
Cardoso Medeiros, Guilherme
Gürsoy, Cemil Cem
Fieback, Moritz
Wu, Lizhou
Jenihhin, Maksim
Taouil, Mottaqiallah
Hamdioui, Said
statement of authorship
Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
source
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
publisher
EDAA
year of publication
2020
pages
p. 792-797
conference name, date
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE 2020), 9 to 13 March, 2020
conference location
Grenoble, France
url
https://doi.org/10.23919/DATE48585.2020.9116278
subject term
rikked
testimine
mikroprotsessorid
keyword
FinFET
SRAM
hard-to-detect faults
defects
DFT
memory testing
ISBN
978-3-9819263-4-7
notes
Bibliogr.: 24 ref
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems