Jervan, G., Orasson, E., Kruus, H., Ubar, R.-J.

full record print

Hybrid BIST optimization using reseeding and test set compaction

author

Jervan, Gert

Orasson, Elmet

Kruus, Helena

Ubar, Raimund-Johannes

statement of authorship

Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar

source

Microprocessors and microsystems

journal volume number month

year of publication

2008

pages

5/6, p. 254-262 : ill

url

https://www.sciencedirect.com/science/article/abs/pii/S0141933108000288

ISSN

0141-9331

notes

Bibliogr.: 27 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

testimine

optimeerimine

Jervan, G., Orasson, E., Kruus, H., Ubar, R.-J. Hybrid BIST optimization using reseeding and test set compaction // Microprocessors and microsystems (2008) 32, 5/6, p. 254-262 : ill. https://www.sciencedirect.com/science/article/abs/pii/S0141933108000288