full record print

MLC: a machine learning based checker for soft error detection in embedded processors

author
statement of authorship
Nosrati, Nooshin; Jenihhin, Maksim; Navabi, Zainalabedin
source
location of publication
New York
publisher
year of publication
pages
Code 183305
conference name, date
28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, 2-14 Sept. 2022
conference location
Torino, Italy
url
ISBN
978-166547355-2
notes
Bibliogr.: 25 ref
TTÜ department
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Nosrati, N., Jenihhin, M., Navabi, Z. MLC: a machine learning based checker for soft error detection in embedded processors // Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. New York : IEEE, 2022. Code 183305. https://doi.org/10.1109/IOLTS56730.2022.9897309