Combining functional and structural approaches in test generation for digital systems
author
statement of authorship
Raimund Ubar
source
journal volume number month
Vol. 38
year of publication
pages
3, p. 317-329 : ill
subject term
notes
Bibliogr.: 33 ref
language
inglise
Ubar, R. Combining functional and structural approaches in test generation for digital systems // Microelectronics reliability (1998) Vol. 38, 3, p. 317-329 : ill.