A tool for random test generation targeting high diagnostic resolution
statement of authorship
Emmanuel Ovie Osimiry, Sergei Kostin, Jaan Raik, Raimund Ubar
location of publication
Tallinn
publisher
year of publication
pages
p. 79-82 : ill
conference name, date
2016 15th Biennial Baltic Electronics Conference, October 3-5, 2016
conference location
Tallinn, Tallinn University of Technology
ISBN
978-1-5090-1392-0
notes
Bibliogr.: 23 ref
TTÜ department
language
inglise
Osimiry, E.O., Kostin, S., Raik, J., Ubar, R. A tool for random test generation targeting high diagnostic resolution // BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2016. p. 79-82 : ill.