A tool for random test generation targeting high diagnostic resolution
vastutusandmed
Emmanuel Ovie Osimiry, Sergei Kostin, Jaan Raik, Raimund Ubar
ilmumiskoht
Tallinn
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 79-82 : ill
konverentsi nimetus, aeg
2016 15th Biennial Baltic Electronics Conference, October 3-5, 2016
konverentsi toimumispaik
Tallinn, Tallinn University of Technology
ISBN
978-1-5090-1392-0
märkused
Bibliogr.: 23 ref
TTÜ struktuuriüksus
keel
inglise
Osimiry, E.O., Kostin, S., Raik, J., Ubar, R. A tool for random test generation targeting high diagnostic resolution // BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2016. p. 79-82 : ill.