FPGA design flow with automated test generation
author
Elst, G.
Diener, Karl-Heinz
Ivask, Eero
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
G.Elst, K.-H.Diener, E.Ivask, J.Raik, R.Ubar
source
Proc. of German 11th Workshop on Test Technology and Reliability of Circuits and Systems : Potsdam, 1999
location of publication
[S.l.]
year of publication
1999
pages
p. 120-123
url
https://masters.donntu.ru/2010/fknt/masyakin/library/article7.pdf
subject term
programmeeritav ventiilmaatriks
otsustusdiagrammid
VLSI-ahelad
testimine
language
inglise