Aleksejev, I., Raik, J., Jutman, A., Ubar, R.-J.

täiskirje prindi

A scalable static test set compaction method for sequential circuits

autor

Aleksejev, Igor

Raik, Jaan

Jutman, Artur

Ubar, Raimund-Johannes

vastutusandmed

Igor Aleksejev, Jaan Raik, Artur Jutman, Raimund Ubar

allikas

Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico

ilmumiskoht

[S.l.]

ilmumisaasta

2008

leheküljed

p. 87-92 : ill

märkused

Bibliogr.: 17 ref

Aleksejev, I., Raik, J., Jutman, A., Ubar, R.-J. A scalable static test set compaction method for sequential circuits // Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico. [S.l.], 2008. p. 87-92 : ill.