On the estimation of complex circuits functional failure rate by machine learning techniques
author
Lange, Thomas
Balakrishnan, Aneesh
Glorieux, Maximilien
Alexandrescu, Dan
Sterpone, Luca
statement of authorship
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
source
49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings
location of publication
[S.l.]
publisher
IEEE
year of publication
2019
pages
p. 35-41 : ill
conference name, date
2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks – Supplemental Volume (DSN-S), 24-27 June 2019
conference location
Portland, OR, USA
url
https://doi.org/10.1109/DSN-S.2019.00021
subject term
vead
rikked
lineaarsed mudelid
vigade teooria
tehisõpe
keyword
transient faults
single event effects
fault injection
gate-level netlist
machine learning
linear least squares
k-nearest neighbors
support vector regression
ISBN
978-1-7281-3028-6
notes
Bibliogr.: 14 ref
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)