APPRAISER : DNN fault resilience analysis employing approximation errors
statement of authorship
Mahdi Taheri, Mohammad Hasan Ahmadilivani, Maksim Jenihhin, Jaan Raik, Masoud Daneshtalab
source
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
location of publication
Piscataway, New Jersey
publisher
year of publication
pages
p. 124−127
conference name, date
26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, May 3-5, 2023
conference location
Tallinn
ISSN
2473-2117
ISBN
979-8-3503-3277-3
notes
Allikas ka: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallinn, Estonia, 2023
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
classifier
Taheri, M., Ahmadilivani, M.H., Jenihhin, M., Raik, J., Daneshtalab, M. APPRAISER : DNN fault resilience analysis employing approximation errors // 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). Piscataway, New Jersey : IEEE, 2023. p. 124−127.