APPRAISER : DNN fault resilience analysis employing approximation errors
statement of authorship
Mahdi Taheri, Mohammad Hasan Ahmadilivani, Maksim Jenihhin, Jaan Raik, Masoud Daneshtalab
source
26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, May 3-5, 2023, Tallinn
location of publication
Piscataway, New Jersey
publisher
year of publication
pages
p. [?]
conference name, date
26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, May 3-5, 2023
conference location
Tallinn
subject term
scientific publication
teaduspublikatsioon
classifier
TTÜ department
language
inglise
Taheri, M., Ahmadilivani, M.H., Jenihhin, M., Raik, J., Daneshtalab, M. APPRAISER : DNN fault resilience analysis employing approximation errors // 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, May 3-5, 2023, Tallinn. Piscataway, New Jersey : IEEE, 2023. p. [?].