APPRAISER : DNN fault resilience analysis employing approximation errors
vastutusandmed
Mahdi Taheri, Mohammad Hasan Ahmadilivani, Maksim Jenihhin, Jaan Raik, Masoud Daneshtalab
allikas
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
ilmumiskoht
Piscataway, New Jersey
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 124−127
konverentsi nimetus, aeg
26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, May 3-5, 2023
konverentsi toimumispaik
Tallinn
ISSN
2473-2117
ISBN
979-8-3503-3277-3
märkused
Allikas ka: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallinn, Estonia, 2023
teaduspublikatsioon
teaduspublikatsioon
TTÜ struktuuriüksus
keel
inglise
klassifikaator
Taheri, M., Ahmadilivani, M.H., Jenihhin, M., Raik, J., Daneshtalab, M. APPRAISER : DNN fault resilience analysis employing approximation errors // 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). Piscataway, New Jersey : IEEE, 2023. p. 124−127.