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IEEE European Test Symposium (ETS)

author
Eggersgluss, Stephan
Hamdioui, Said
Jutman, Artur
Michael, Maria K.
Raik, Jaan
statement of authorship
Stephan Eggersglüß, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Tahoori, Elena-IoanaVatajelu
source
location of publication
[S.l.]
publisher
year of publication
pages
4 p
conference name, date
2019 IEEE International Test Conference (ITC)
conference location
Washington, DC, USA
url
ISSN
2378-2250
1089-3539
ISBN
978-1-7281-4823-6
Open Access
Open Access
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
subject term
name of the institution
European Test Symposium (ETS)
subject of location
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Eggersgluss, S., Hamdioui, S., Jutman, A., Michael, M.K., Raik, J. et al. IEEE European Test Symposium (ETS) // 2019 IEEE International Test Conference (ITC). [S.l.] : IEEE, 2019. 4 p. https://doi.org/10.1109/ITC44170.2019.9000148