print

IEEE European Test Symposium (ETS)

author
Eggersgluss, Stephan
Hamdioui, Said
Jutman, Artur
Michael, Maria K.
Raik, Jaan
statement of authorship
Stephan Eggersglüß, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Tahoori, Elena-IoanaVatajelu
source
2019 IEEE International Test Conference (ITC)
location of publication
[S.l.]
publisher
IEEE
year of publication
2019
pages
4 p
conference name, date
2019 IEEE International Test Conference (ITC)
conference location
Washington, DC, USA
url
https://doi.org/10.1109/ITC44170.2019.9000148
subject term
elektroonika
testimine
töökindlus
konverentsid
Scopus
Conference proceeding at Scopus
Article at Scopus
WOS
Article at WOS
kvartiil
Q1
category (general)
Mathematics
Engineering
category (sub)
Mathematics. Applied mathematics
Engineering. Electrical and electronic engineering
name of the institution
European Test Symposium (ETS)
subject of location
Euroopa
ISSN
2378-2250
1089-3539
ISBN
978-1-7281-4823-6
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
3.1
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Eggersgluss, S., Hamdioui, S., Jutman, A., Michael, M.K., Raik, J. et al. IEEE European Test Symposium (ETS) // 2019 IEEE International Test Conference (ITC). [S.l.] : IEEE, 2019. 4 p. https://doi.org/10.1109/ITC44170.2019.9000148