Hierarchical identification of untestable faults in sequential circuits
statement of authorship
Jaan Raik, Raimund Ubar, Anna Krivenko, Margus Kruus
location of publication
Los Alamitos
publisher
year of publication
pages
p. 668-671 : ill
conference name, date
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, 29-31 August, 2007
conference location
Lübeck, Germany
ISBN
978-0-7695-2978-3
notes
Bibliogr.: 8 ref
TTÜ department
language
inglise
subject term
Raik, J., Ubar, R.-J., Krivenko, A., Kruus, M. Hierarchical identification of untestable faults in sequential circuits // 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings. Los Alamitos : IEEE Computer Society, 2007. p. 668-671 : ill.