Cibakova, T., Fischerova, M., Gramatova, E., Kuzmicz, W., Pleskacz, W., Raik, J., Ubar, R.-J.

full record print

Defect-oriented test generation using probabilistic estimation

author

Cibakova, Tatiana

Fischerova, Maria

Gramatova, Elena

Kuzmicz, W.

Pleskacz, Witold A.

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

T.Cibakova, M.Fischerova, E.Gramatova, W.Kuzmicz, W.Pleskacz, J.Raik, R.Ubar

source

Proceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 2000

location of publication

[S. l.]

year of publication

2001

pages

p. 131-136 : ill

ISBN

83-87202-98-3

notes

Bibliogr.: 6 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

integraallülitused

defektid

rikked

testimine

hindamine

tõenäosus

Cibakova, T., Fischerova, M., Gramatova, E., Kuzmicz, W., Pleskacz, W., Raik, J., Ubar, R.-J. Defect-oriented test generation using probabilistic estimation // Proceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 2000. [S. l.], 2001. p. 131-136 : ill.