Defect-oriented test generation using probabilistic estimation
autor
vastutusandmed
T.Cibakova, M.Fischerova, E.Gramatova, W.Kuzmicz, W.Pleskacz, J.Raik, R.Ubar
ilmumiskoht
[S. l.]
ilmumisaasta
leheküljed
p. 131-136 : ill
ISBN
83-87202-98-3
märkused
Bibliogr.: 6 ref
keel
inglise
Cibakova, T., Fischerova, M., Gramatova, E., Kuzmicz, W., Pleskacz, W., Raik, J., Ubar, R.-J. Defect-oriented test generation using probabilistic estimation // Proceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 2000. [S. l.], 2001. p. 131-136 : ill.