Diagnostic modeling of digital systems with multi-level decision diagrams
author
Ubar, Raimund-Johannes
Raik, Jaan
Jutman, Artur
Jenihhin, Maksim
statement of authorship
Raimund Ubar, Jaan Raik, Artur Jutman, Maksim Jenihhin
source
Design and test technology for dependable systems-on-chip
location of publication
Hershey
publisher
Information Science Reference
year of publication
2011
pages
p. 92-118 : ill
url
https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams
subject term
digitaaltehnika
rikked
vead
diagnostika (tehnika)
modelleerimine (teadus)
simulatsioon
testimine
otsustusdiagrammid
ISBN
978-1-60960-212-3
notes
Bibliogr. p. 115-118
language
inglise