Post-silicon validation of IEEE 1687 reconfigurable scan networks
author
Damljanovic, Aleksa
Jutman, Artur
Squillero, Giovanni
Tšertov, Anton
statement of authorship
Aleksa Damljanovic, Artur Jutman, Giovanni Squillero, Anton Tsertov
source
2019 IEEE European Test Symposium (ETS) : proceedings
location of publication
Danvers
publisher
IEEE
year of publication
2019
pages
6 p. : ill
conference name, date
2019 IEEE European Test Symposium ETS 2019, May 27 - 31, 2019
conference location
Baden Baden, Germany
url
https://doi.org/10.1109/ETS.2019.8791546
subject term
pooljuhid
testimine
standardid (normid)
keyword
validation
pattern generation
reconfigurable scan networks
IEEE 1687
ISSN
1558-1780
1530-1877
ISBN
978-1-7281-1173-5
978-1-7281-1174-2
notes
Bibliogr.: 14 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)