On using genetic algorithm for test generation
statement of authorship
M.Brik, J.Raik, R.Ubar, E.Ivask
location of publication
Tallinn
publisher
year of publication
pages
p. 233-236 : ill
subject term
ISBN
9985-59-462-2
notes
Bibliogr.: 8 ref
language
inglise
Brik, M., Raik, J., Ubar, R.-J., Ivask, E. On using genetic algorithm for test generation // BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2004. p. 233-236 : ill.