Ubar, R.-J., Raik, J., Nõmmeots, T. - TalTech Research Portal

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Testability guided hierarchical test generation with decision diagrams

author

Ubar, Raimund-Johannes

Raik, Jaan

Nõmmeots, Tanel

statement of authorship

R.Ubar, J.Raik, T.Nõmmeots

source

20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002

location of publication

Copenhagen

publisher

TechnoData

year of publication

2002

pages

p. 265-271

Ubar, R.-J., Raik, J., Nõmmeots, T. Testability guided hierarchical test generation with decision diagrams // 20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002. Copenhagen : TechnoData, 2002. p. 265-271.