Skobtsov, Y.A., Ivanov, D.E., Skobtsov, V.Y., Ubar, R.-J.

Evolutionary approach to the functional test generation for digital circuits

author

Skobtsov, Y.A.

Ivanov, D.E.

Skobtsov, V.Y.

Ubar, Raimund-Johannes

statement of authorship

Y.A.Skobtsov, D.E.Ivanov, V.Y.Skobtsov, R.Ubar

source

BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia

location of publication

Tallinn

publisher

Tallinn University of Technology

year of publication

2004

pages

p. 229-232 : ill

subject term

digitaalintegraallülitused

testimine

geneetilised algoritmid

ISBN

9985-59-462-2

notes

Bibliogr.: 5 ref

language

inglise

Skobtsov, Y.A., Ivanov, D.E., Skobtsov, V.Y., Ubar, R.-J. Evolutionary approach to the functional test generation for digital circuits // BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2004. p. 229-232 : ill.