Design and test technology for dependable systems-on-chip
statement of authorship
[editors] Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus
location of publication
Hershey
publisher
year of publication
pages
550 p. : ill
subject term
ISBN
978-1-60960-212-3
language
inglise
Ubar, R., Raik, J., Vierhaus, H.T. (ed.). Design and test technology for dependable systems-on-chip. Hershey : Information Science Reference, 2011. 550 p. : ill.