Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits
author
Jenihhin, Maksim
Squillero, Giovanni
Tihhomirov, Valentin
Kostin, Sergei
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros
source
Journal of electronic testing : theory and applications (JETTA)
publisher
Springer
journal volume number month
Vol. 32, 3
year of publication
2016
pages
p. 273-289 : ill
url
https://doi.org/10.1007/s10836-016-5589-x
subject term
elektronlülitused
loogikaelemendid
diagnostika (tehnika)
keyword
hardware rejuvenation
aging
NBTI
critical path identification
logic circuit
evolutionary computation
microGP
zamiaCAD
ISSN
0923-8174
notes
Bibliogr.: 44 ref
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/18040
https://www.scopus.com/record/display.uri?eid=2-s2.0-84966714453&origin=inward&txGid=3b4ba7ac260a393cbe6bed59b4d314b9
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20ELECTRON%20TEST&year=2016
https://www.webofscience.com/wos/woscc/full-record/WOS:000377449900004
category (general)
Engineering
Tehnika
category (sub)
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
quartile
Q2
TalTech department
arvutitehnika instituut
language
inglise