An approach for PSL assertion coverage analysis with high-level decision diagrams
statement of authorship
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Tatjana Shchenova
location of publication
Kharkov
year of publication
pages
p. 13-16 : ill
conference name, date
IEEE East-West Design & Test Symposium (EWDTS'10), September 17-20, 2010
conference location
St. Petersburg, Russia
notes
Bibliogr.: 15 ref
language
inglise
Jenihhin, M., Raik, J., Ubar, R., Shchenova, T. An approach for PSL assertion coverage analysis with high-level decision diagrams // Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010. Kharkov : Kharkov National University of Radioelectronics, 2010. p. 13-16 : ill.