prindi

An approach for PSL assertion coverage analysis with high-level decision diagrams

autor
Jenihhin, Maksim
Raik, Jaan
Ubar, Raimund-Johannes
Shchenova, Tatjana
vastutusandmed
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Tatjana Shchenova
allikas
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010
ilmumiskoht
Kharkov
kirjastus/väljaandja
Kharkov National University of Radioelectronics
ilmumisaasta
2010
leheküljed
p. 13-16 : ill
konverentsi nimetus, aeg
IEEE East-West Design & Test Symposium (EWDTS'10), September 17-20, 2010
konverentsi toimumispaik
St. Petersburg, Russia
leitav
https://ieeexplore.ieee.org/document/5742048
märksõna
disain
simulatsioon
kinnitusdetailid
skeemid
testimine
märkused
Bibliogr.: 15 ref
keel
inglise
Jenihhin, M., Raik, J., Ubar, R., Shchenova, T. An approach for PSL assertion coverage analysis with high-level decision diagrams // Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010. Kharkov : Kharkov National University of Radioelectronics, 2010. p. 13-16 : ill. https://ieeexplore.ieee.org/document/5742048