print

Sequential circuit test generation using decision diagram models

author
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik, Raimund Ubar
source
Design, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings
location of publication
Los Alamitos
publisher
IEEE Computer Society
year of publication
1999
pages
p. 736-740: ill
ISBN
0-7695-0078-1
notes
Bibl. 8 ref
Raik, J., Ubar, R. Sequential circuit test generation using decision diagram models // Design, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings. Los Alamitos : IEEE Computer Society, 1999. p. 736-740: ill.