Fault oriented test pattern generation for sequential circuits using genetic algorithms
statement of authorship
E.Ivask, R.Ubar, J.Raik
source
location of publication
Cascais
year of publication
pages
p. 319-320
subject term
language
inglise
Ivask, E., Ubar, R., Raik, J. Fault oriented test pattern generation for sequential circuits using genetic algorithms // IEEE European Test Workshop. Cascais, 2000. p. 319-320.