Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
author
statement of authorship
Mahdi Taheri, Natalia Cherezova, Mohammad Saeed Ansari, Maksim Jenihhin, Ali Mahani, Masoud Daneshtalab, Jaan Raik
source
Proceedings of the Twenty Fifth International Symposium on Quality ElectronicDesign : ISQED 2024
publisher
year of publication
pages
8 p. : ill
conference name, date
25th International Symposium on Quality Electronic Design (ISQED), 3 April 2024 – 5 April 2024
conference location
San Francisco, California, United States
url
ISBN
979-835030927-0
notes
Bibliogr.: 29 ref
scientific publication
teaduspublikatsioon
TalTech department
language
inglise
WOS
quartile
classifier
category (general)
Taheri, M., Cherezova, N., Ansari, M.S., Jenihhin, M., Mahani, A., Daneshtalab, M., Raik, J. Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators // Proceedings of the Twenty Fifth International Symposium on Quality ElectronicDesign : ISQED 2024. : IEEE, 2024. 8 p. : ill. https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10528372 https://doi.org/10.1109/ISQED60706.2024.10528372