DECIDER : a system for hierarchical test pattern generation
author
statement of authorship
Jaan Raik, Raimund Ubar
journal volume number month
3
year of publication
pages
p. 40-45 : ill
subject term
ISSN
1563-0064
notes
Bibliogr.: 16 ref
Special issue: Proceedings of East-West Design & Test Conference (EWDTC’03): Yalta, Alushta, Crimea, Ukraine, September 17-21, 2003
language
inglise
Raik, J., Ubar, R.-J. DECIDER : a system for hierarchical test pattern generation // Radioelectronics and informatics (2003) 3, p. 40-45 : ill.