Sequential test set compaction in LFSR reseeding
statement of authorship
Artur Jutman, Igor Aleksejev, Jaan Raik
location of publication
Hershey
publisher
year of publication
pages
p. 476-493 : ill
ISBN
978-1-60960-212-3
notes
Bibliogr. p. 491-493
language
inglise
Jutman, A., Aleksejev, I., Raik, J. Sequential test set compaction in LFSR reseeding // Design and test technology for dependable systems-on-chip. Hershey : Information Science Reference, 2011. p. 476-493 : ill.