Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]
author
Jürimägi, Lembit
Ubar, Raimund-Johannes
statement of authorship
Lembit Jürimägi, Raimund Ubar
source
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
publisher
IEEE
year of publication
2018
pages
4 p. : ill
conference name, date
16th Biennial Baltic Electronics Conference (BEC), October 8-10, 2018
conference location
Tallinn, Estonia
url
https://doi.org/10.1109/BEC.2018.8600967
subject term
digitaaltehnika
diagnostika (tehnika)
rikked
testimine
elektronlülitused
keyword
combinational circuits
conditional fault collapsing
structurally synthesized BDDs
fault simulation
ISSN
1736-3705
ISBN
978-1-5386-7313-3
notes
Bibliogr.: 23 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems