Combined pseudo-exhaustive and deterministic testing of array multipliers
author
Oyeniran, Adeboye Stephen
Azad, Siavoosh Payandeh
Ubar, Raimund-Johannes
statement of authorship
Adeboye Stephen Oyeniran, Siavoosh Payandeh Azad, Raimund Ubar
source
2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings
location of publication
Romania
publisher
IEEE
year of publication
2018
pages
6 p. : ill
conference name, date
2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR), 24-26 May 2018
conference location
Cluj-Napoca, Romania
url
https://doi.org/10.1109/AQTR.2018.8402708
subject term
mikroprotsessorid
testimine
meetodid
arvutiprogrammid
rikked
keyword
multipliers
pseudo-exhaustive test
deterministic test sequences
data-controlled segmentation
extended fault class
ISBN
978-1-5386-2204-9
notes
Bibliogr.: 26 ref
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems