High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
author
Oyeniran, Adeboye Stephen
Ubar, Raimund-Johannes
Jenihhin, Maksim
Raik, Jaan
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
source
Journal of electronic testing : theory and applications
journal volume number month
vol. 36
year of publication
2020
pages
p. 87-103
url
https://doi.org/10.1007/s10836-020-05856-7
subject term
testimine
mudelprojekteerimine
kompuutermodelleerimine
vead
simulatsioon
keyword
processor testing
high-level control fault model
functional test generation
fault simulation
high-level fault coverage
low-level fault redundancy
ISSN
0923-8174
notes
Bibliogr.: 43 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems