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book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
1 - 2
keyword
91
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
Implementation-Independent Testing of Microprocessors
5.
microprocessor testing
6.
ARM processor
7.
crypto processor
8.
digital signal processor (DSP)
9.
multicore processor
10.
multi-processor
11.
multi-processor system-on-chip
12.
multi-processor system-on-chips (MPSoCs)
13.
Muti-Processor System on Chip (MPSoC)
14.
processor architecture
15.
processor designs
16.
processor-centric board
17.
processor-centric board test
18.
accelerated testing
19.
acoustomechanical testing
20.
anaerobic testing
21.
aspect-oriented testing
22.
at-speed testing
23.
benchmark testing
24.
Berridge testing
25.
burst testing
26.
cancer genomic testing
27.
compliance testing
28.
compositional testing
29.
computer aided testing
30.
conformance testing
31.
courses on electronic testing and design
32.
cybersecurity testing
33.
D. non-destructive testing
34.
deformation testing
35.
design field testing
36.
destructive testing
37.
eddy current testing
38.
eddy current testing (ECT)
39.
erosion testing
40.
fatigue testing
41.
fire testing
42.
hierarchical testing
43.
hypotheses testing
44.
integration testing
45.
laboratory scale testing
46.
load testing
47.
macro mechanical testing and green surface tribology
48.
material testing
49.
materials testing
50.
measurement and testing
51.
mechanical testing
52.
memory testing
53.
metamorphic testing
54.
model based testing
55.
model-based mutation testing
56.
model-based testing
57.
mutation testing
58.
network-testing
59.
non destructive testing
60.
nondestructive testing
61.
non-destructive testing
62.
on-site testing
63.
pin on disc wear testing
64.
PMU calibration testing
65.
PMU testing
66.
point-of-care testing
67.
real-time HiL testing
68.
regression testing
69.
robustness testing
70.
safety and security testing
71.
scenario testing
72.
scratch testing
73.
security testing
74.
small-scale fire testing
75.
software testing
76.
software-in-the-loop (SIL) testing
77.
stand-alone testing
78.
stress-testing
79.
substation testing methods
80.
system testing
81.
tensile testing
82.
testing
83.
testing methods
84.
testing of digital devices
85.
testing of generator
86.
testing of phasor measurement units
87.
two-dimensional array testing
88.
wafer testing
89.
wear testing
90.
vibration testing
91.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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