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book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
1 - 2
keyword
101
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
Implementation-Independent Testing of Microprocessors
5.
microprocessor testing
6.
ARM processor
7.
crypto processor
8.
digital signal processor (DSP)
9.
multicore processor
10.
multi-processor
11.
multi-processor system-on-chip
12.
multi-processor system-on-chips (MPSoCs)
13.
Muti-Processor System on Chip (MPSoC)
14.
processor architecture
15.
processor designs
16.
processor-centric board
17.
processor-centric board test
18.
RISC-V Processor
19.
accelerated testing
20.
acoustomechanical testing
21.
anaerobic testing
22.
aspect-oriented testing
23.
assessment and testing
24.
at-speed testing
25.
benchmark testing
26.
Berridge testing
27.
burst testing
28.
cancer genomic testing
29.
compliance testing
30.
compositional testing
31.
computer aided testing
32.
cone heater testing
33.
conformance testing
34.
courses on electronic testing and design
35.
cybersecurity testing
36.
D. non-destructive testing
37.
deformation testing
38.
design field testing
39.
destructive testing
40.
eddy current testing
41.
eddy current testing (ECT)
42.
erosion testing
43.
fabric testing
44.
fatigue testing
45.
fire testing
46.
hierarchical testing
47.
hypotheses testing
48.
integration testing
49.
laboratory scale testing
50.
load testing
51.
macro mechanical testing and green surface tribology
52.
material testing
53.
materials testing
54.
measurement and testing
55.
mechanical testing
56.
memory testing
57.
metamorphic testing
58.
model based testing
59.
model-based mutation testing
60.
model-based testing
61.
multi-scenario testing
62.
mutation testing
63.
network-testing
64.
non destructive testing
65.
nondestructive testing
66.
non-destructive testing
67.
non-destructive testing (NDT)
68.
On-site drug testing
69.
on-site testing
70.
pin on disc wear testing
71.
PMU calibration testing
72.
PMU testing
73.
point-of-care testing
74.
real-time HiL testing
75.
regression testing
76.
robustness testing
77.
safety and security testing
78.
scenario testing
79.
Scenario-Based Testing
80.
scratch testing
81.
security testing
82.
shear testing
83.
small-scale fire testing
84.
software testing
85.
software-in-the-loop (SIL) testing
86.
stand-alone testing
87.
stress-testing
88.
substation testing methods
89.
system testing
90.
tensile testing
91.
testing
92.
testing methods
93.
testing of digital devices
94.
testing of generator
95.
testing of phasor measurement units
96.
two-dimensional array testing
97.
ultrasonic testing
98.
wafer testing
99.
wear testing
100.
vibration testing
101.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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