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book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
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keyword
83
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
microprocessor testing
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor designs
13.
processor-centric board
14.
processor-centric board test
15.
accelerated testing
16.
acoustomechanical testing
17.
anaerobic testing
18.
aspect-oriented testing
19.
at-speed testing
20.
benchmark testing
21.
Berridge testing
22.
cancer genomic testing
23.
compliance testing
24.
compositional testing
25.
computer aided testing
26.
conformance testing
27.
courses on electronic testing and design
28.
cybersecurity testing
29.
D. non-destructive testing
30.
design field testing
31.
eddy current testing
32.
erosion testing
33.
fatigue testing
34.
fire testing
35.
hierarchical testing
36.
hypotheses testing
37.
integration testing
38.
laboratory scale testing
39.
load testing
40.
macro mechanical testing and green surface tribology
41.
material testing
42.
materials testing
43.
measurement and testing
44.
mechanical testing
45.
memory testing
46.
metamorphic testing
47.
model based testing
48.
model-based mutation testing
49.
model-based testing
50.
mutation testing
51.
network-testing
52.
non destructive testing
53.
nondestructive testing
54.
non-destructive testing
55.
on-site testing
56.
pin on disc wear testing
57.
PMU calibration testing
58.
PMU testing
59.
point-of-care testing
60.
real-time HiL testing
61.
regression testing
62.
robustness testing
63.
scenario testing
64.
scratch testing
65.
security testing
66.
small-scale fire testing
67.
software testing
68.
software-in-the-loop (SIL) testing
69.
stand-alone testing
70.
stress-testing
71.
substation testing methods
72.
system testing
73.
tensile testing
74.
testing
75.
testing methods
76.
testing of digital devices
77.
testing of generator
78.
testing of phasor measurement units
79.
two-dimensional array testing
80.
wafer testing
81.
wear testing
82.
vibration testing
83.
virtual testing
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