Analysis of a test method for delay faults in NoC interconnects
statement of authorship
Tomas Bengtsson, Artur Jutman, Shashi Kumar, Raimund Ubar, Zebo Peng
location of publication
Kharkov
year of publication
pages
p. 42-46 : ill
subject term
ISBN
966-659-124-3
notes
Bibliogr.: 17 ref
language
inglise
Bengtsson, T., Jutman, A., Kumar, S., Ubar, R.-J., Peng, Z. Analysis of a test method for delay faults in NoC interconnects // Proceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 2006. Kharkov : Kharkov National University of Radioelectronics, 2006. p. 42-46 : ill.