Bengtsson, T., Jutman, A., Kumar, S., Ubar, R.-J., Peng, Z.

full record print

Analysis of a test method for delay faults in NoC interconnects

author

Bengtsson, Tomas

Jutman, Artur

Kumar, Shashi

Ubar, Raimund-Johannes

Peng, Zebo

statement of authorship

Tomas Bengtsson, Artur Jutman, Shashi Kumar, Raimund Ubar, Zebo Peng

source

Proceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 2006

location of publication

Kharkov

publisher

Kharkov National University of Radioelectronics

year of publication

2006

pages

p. 42-46 : ill

ISBN

966-659-124-3

notes

Bibliogr.: 17 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

integraallülitused

testimine

Bengtsson, T., Jutman, A., Kumar, S., Ubar, R.-J., Peng, Z. Analysis of a test method for delay faults in NoC interconnects // Proceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 2006. Kharkov : Kharkov National University of Radioelectronics, 2006. p. 42-46 : ill.