Multi-view modeling for MPSoC design aspects [Online resource]
author
Vain, Jüri
Apneet Kaur
Tsiopoulos, Leonidas
Raik, Jaan
Jenihhin, Maksim
statement of authorship
Juri Vain, Apneet Kaur, Leonidas Tsiopoulos, Jaan Raik, Maksim Jenihhin
source
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
publisher
IEEE
year of publication
2018
pages
4 p.: ill
conference name, date
16th Biennial Baltic Electronics Conference (BEC), October 8-10, 2018
conference location
Tallinn, Estonia
url
https://doi.org/10.1109/BEC.2018.8600986
subject term
kiipvõrgud
testimine
programmeerimiskeeled
tarkvaraarendus
keyword
network-on-chip
model-checking
UPPAAL timed automata
design aspects
Design-by-Contract
ISSN
1736-3705
ISBN
978-1-5386-7313-3
notes
Bibliogr.: 10 ref
TTÜ department
tarkvarateaduse instituut
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for digital forensics and cyber security
Centre for maritime cybersecurity
High-assurance software laboratory
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems