Test generation for microprocessor control mechanisms
statement of authorship
Lohuaru, T., Ubar, R.
source
FTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)
location of publication
Varna
publisher
year of publication
pages
p. 305-311
conference name, date
10th International Conference on Fault-Tolerant Systems and Diagnostics, 1987
conference location
Varna
subject term
TTÜ department
language
inglise
Lohuaru, T., Ubar, R. Test generation for microprocessor control mechanisms // FTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987). Varna : s.i., 1987. p. 305-311.