print

Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications

author
Cherezova, Natalia
Shibin, Konstantin
Jenihhin, Maksim
Jutman, Artur
statement of authorship
Natalia Cherezova, Konstantin Shibin, Maksim Jenihhin, Artur Jutman
source
Microelectronics reliability
publisher
Elsevier
journal volume number month
vol. 146
year of publication
2023
pages
art. 115010, 10 p. : ill
url
https://doi.org/10.1016/j.microrel.2023.115010
subject term
töökindlus
kiirendid
rikked
tulemused
veakindlus
tõrketaluvus
keyword
cross-layer reliability
fault effects
fault-tolerance
SoC FPGA
soft errors
ISSN
0026-2714
notes
Bibliogr.: 75 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
Journal metrics at Scopus
Article at Scopus
WOS
Journal metrics at WOS
Article at WOS
category (general)
Engineering
Physics and astronomy
Materials science
category (sub)
Engineering. Safety, risk, reliability and quality
Engineering. Electrical and electronic engineering
Physics and astronomy. Atomic and molecular physics, and optics
Physics and astronomy. Condensed matter physics
Materials science. Surfaces, coatings and films
Materials science. Electronic, optical and magnetic materials
kvartiil
Q2
TTÜ department
arvutisüsteemide instituut
language
inglise
Cherezova, N., Shibin, K., Jenihhin, M., Jutman, A. Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications // Microelectronics reliability (2023) vol. 146, art. 115010, 10 p. : ill. https://doi.org/10.1016/j.microrel.2023.115010