Test generation for digital systems
author
statement of authorship
Ubar, R.
source
Digest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy
location of publication
New York
publisher
IEEE Computer Soc. Press
year of publication
pages
p. 374-377
conference name, date
13th Annual International Symposium on Fault-Tolerant Computing (FTCS), June 28 - 30, 1983
conference location
Milano
subject term
TTÜ department
language
inglise
Ubar, R. Test generation for digital systems // Digest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy. New York : IEEE Computer Soc. Press, 1983. p. 374-377.