Test generation for digital systems
autor
vastutusandmed
Ubar, R.
allikas
Digest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy
ilmumiskoht
New York
kirjastus/väljaandja
IEEE Computer Soc. Press
ilmumisaasta
leheküljed
p. 374-377
konverentsi nimetus, aeg
13th Annual International Symposium on Fault-Tolerant Computing (FTCS), June 28 - 30, 1983
konverentsi toimumispaik
Milano
märksõna
TTÜ struktuuriüksus
keel
inglise
Ubar, R. Test generation for digital systems // Digest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy. New York : IEEE Computer Soc. Press, 1983. p. 374-377.