Test pattern generation for microprocessor systems on the alternative graph model
autor
vastutusandmed
Ubar, R.
allikas
Proceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 1983
ilmumiskoht
Budapest
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 403-410
konverentsi nimetus, aeg
3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), October 3 - 5, 1983
konverentsi toimumispaik
Moscow, Russia
märksõna
TTÜ struktuuriüksus
keel
inglise
Ubar, R. Test pattern generation for microprocessor systems on the alternative graph model // Proceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 1983. Budapest : IMEKO, 1985. p. 403-410.