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New categories of Safe Faults in a processor-based Embedded System

author
statement of authorship
C. Gursoy, M. Jenihhin, A.S. Oyeniran, D. Piumatti, J. Raik, M. Sonza Reorda, R. Ubar
source
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
location of publication
Danvers
publisher
year of publication
pages
4 p. : ill
conference name, date
22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 24-26 April 2019
conference location
Cluj-Napoca, Romania
url
ISSN
2473-2117
ISBN
978-1-7281-0073-9
notes
Bibliogr.: 17 ref
TTÜ department
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Gürsoy, C., Jenihhin, M., Oyeniran, A.S., Piumatti, D., Raik, J., Sonza Reorda, M., Ubar, R. New categories of Safe Faults in a processor-based Embedded System // 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings. Danvers : IEEE, 2019. 4 p. : ill. https://doi.org/10.1109/DDECS.2019.8724642