Gürsoy, C., Jenihhin, M., Oyeniran, A.S., Piumatti, D., Raik, J., Sonza Reorda, M., Ubar, R.

New categories of Safe Faults in a processor-based Embedded System

author

Gürsoy, Cemil Cem

Jenihhin, Maksim

Oyeniran, Adeboye Stephen

Piumatti, Davide

Raik, Jaan

Sonza Reorda, Matteo

Ubar, Raimund-Johannes

statement of authorship

C. Gursoy, M. Jenihhin, A.S. Oyeniran, D. Piumatti, J. Raik, M. Sonza Reorda, R. Ubar

source

2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings

location of publication

Danvers

publisher

IEEE

year of publication

2019

pages

4 p. : ill

conference name, date

22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 24-26 April 2019

conference location

Cluj-Napoca, Romania

url

https://doi.org/10.1109/DDECS.2019.8724642

subject term

manussüsteemid

protsessorid

rikked

ISSN

2473-2117

ISBN

978-1-7281-0073-9

notes

Bibliogr.: 17 ref

TTÜ department

arvutisüsteemide instituut

language

inglise

Uurimisrühm

Centre for trustworthy and efficient computing hardware (TECH)

Centre of dependable computing systems

Gürsoy, C., Jenihhin, M., Oyeniran, A.S., Piumatti, D., Raik, J., Sonza Reorda, M., Ubar, R. New categories of Safe Faults in a processor-based Embedded System // 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings. Danvers : IEEE, 2019. 4 p. : ill. https://doi.org/10.1109/DDECS.2019.8724642