Model based testing of distributed time critical systems
statement of authorship
Jüri Vain, Gert Kanter, Seshadhri Srinivasan
source
2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO 2017) : Noida, India 20-22 September 2017
location of publication
Piscataway
publisher
year of publication
pages
p. 99-105 : ill
conference name, date
6th International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), September 20-22, 2017
conference location
Noida, India
ISBN
978-1-5090-3013-2
notes
Bibliogr.: 13 ref
TTÜ department
language
inglise
subject term
Vain, J., Kanter, G., Srinivasan, S. Model based testing of distributed time critical systems // 2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO 2017) : Noida, India 20-22 September 2017. Piscataway : IEEE, 2017. p. 99-105 : ill.