prindi

Model based testing of distributed time critical systems

autor
Vain, Jüri
Kanter, Gert
Srinivasan, Seshadhri
vastutusandmed
Jüri Vain, Gert Kanter, Seshadhri Srinivasan
allikas
2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO 2017) : Noida, India 20-22 September 2017
ilmumiskoht
Piscataway
kirjastus/väljaandja
IEEE
ilmumisaasta
2017
leheküljed
p. 99-105 : ill
konverentsi nimetus, aeg
6th International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), September 20-22, 2017
konverentsi toimumispaik
Noida, India
leitav
https://doi.org/10.1109/ICRITO.2017.8342406
märksõna
tarkvaraarendus
testimine
ISBN
978-1-5090-3013-2
märkused
Bibliogr.: 13 ref
TTÜ struktuuriüksus
tarkvarateaduse instituut
keel
inglise
Vain, J., Kanter, G., Srinivasan, S. Model based testing of distributed time critical systems // 2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO 2017) : Noida, India 20-22 September 2017. Piscataway : IEEE, 2017. p. 99-105 : ill. https://doi.org/10.1109/ICRITO.2017.8342406