Multiple control fault testing in digital systems with high-level decision diagrams
author
Ubar, Raimund-Johannes
Oyeniran, Adeboye Stephen
statement of authorship
Raimund Ubar, Stephen Adeboye Oyeniran
source
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
location of publication
[S.l.]
publisher
IEEE
year of publication
2016
pages
[6] p. : ill
conference name, date
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR), 19-21 May, 2016
conference location
Cluj-Napoca, Romania
url
http://dx.doi.org/10.1109/AQTR.2016.7501287
subject term
elektronlülitused
rikked
testimine
keyword
digital systems
control faults
fault masking
test generation
test optimization
ISBN
978-1-4673-8690-6
notes
Bibliogr.: 17 ref
TalTech department
arvutitehnika instituut
language
inglise