Kostin, S., Raik, J., Ubar, R., Jenihhin, M. et al.

full record print

Hierarchical identification of NBTI-critical gates in nanoscale logic

author

Kostin, Sergei

Raik, Jaan

Ubar, Raimund-Johannes

Jenihhin, Maksim

statement of authorship

Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, ... [et al.]

source

LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014

location of publication

[S.l.]

publisher

IEEE

year of publication

2014

pages

[6] p. : ill

conference name, date

15th IEEE Latin-American Test Workshop, March 12-15, 2014

conference location

Fortaleza, Brazil

ISBN

978-1-4799-4711-9

notes

Bibliogr.: 13 ref

TTÜ department

arvutitehnika instituut

language

inglise

Märksõnad ja võtmesõnad

subject term

elektronlülitused

rikked

keyword

NBTI-critical gate

critical path identification

static timing analysis

aging

logic circuit

Kostin, S., Raik, J., Ubar, R., Jenihhin, M. et al. Hierarchical identification of NBTI-critical gates in nanoscale logic // LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014. [S.l.] : IEEE, 2014. [6] p. : ill.