Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
statement of authorship
Raimund Ubar, Sergei Kostin, Jaan Raik
source
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
location of publication
Piscataway
publisher
year of publication
pages
p. 36-41 : ill [CD-ROM]
conference name, date
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 26-28 March, 2013
conference location
Abu Dhabi, UAE
subject term
keyword
ISBN
978-1-4673-6038-8
notes
Bibliogr.: 21 ref
TTÜ department
language
inglise
Ubar, R., Kostin, S., Raik, J. Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource] // 2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE. Piscataway : IEEE, 2013. p. 36-41 : ill [CD-ROM].